Time Domain Method for Measurement of S-Parameters of Passive Devices
S-Parameters have become the defacto standard for describing passive devices, in part to the ever-increasing need to predict and understand signal integrity issues that are problematic in both today and tomorrow's high-speed serial designs. This article describes hardware and software techniques used in a TDR/TDT based instrument to measure S-Parameters.
Techniques include TDR pulser/sampler design, coherent interleaved sampling timebase, switch matrix implementation for signal routing, and software algorithms for noise reduction and de-embedding. Comparisons to frequency domain S-Parameter measurements are also discussed.
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- New jersey Institute of Technology (NJIT)
- Intersection between Warren & Summit Streets
- Newark, New Jersey
- United States 07102
- Building: NJIT ECE Center
- Room Number: Room 202
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- Russell C. Pepe 201-960-6796 rcpepe@ieee.org
- Starts 07 September 2011 03:00 PM UTC
- Ends 12 October 2011 09:00 PM UTC
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Pete Pupalaikis
Time Domain Method for Measurement of S-Parameters of Passive Devices
S-Parameters have become the defacto standard for describing passive devices, in part to the ever-increasing need to predict and understand signal integrity issues that are problematic in both today and tomorrow's high-speed serial designs. This article describes hardware and software techniques used in a TDR/TDT based instrument to measure S-Parameters. Techniques include TDR pulser/sampler design, coherent interleaved sampling timebase, switch matrix implementation for signal routing, and software algorithms for noise reduction and de-embedding. Comparisons to frequency domain S-Parameter measurements are also discussed.
Email:
Address:New York, United States
Alan Blankman, PhD.
Time Domain Method for Measurement of S-Parameters of Passive Devices
S-Parameters have become the defacto standard for describing passive devices, in part to the ever-increasing need to predict and understand signal integrity issues that are problematic in both today and tomorrow's high-speed serial designs. This article describes hardware and software techniques used in a TDR/TDT based instrument to measure S-Parameters. Techniques include TDR pulser/sampler design, coherent interleaved sampling timebase, switch matrix implementation for signal routing, and software algorithms for noise reduction and de-embedding. Comparisons to frequency domain S-Parameter measurements are also discussed.
Biography: Alan Blankman is Signal Integrity Product Marketing Manager at LeCroy Corporation, focusing on signal integrity products and applications, including the SPARQ series network analyzers and serial data analysis software. He has a Ph.D. degree in high-energy physics from University of Pennsylvania, and has over 20 years experience developing instrumentation and software solutions for high-energy physicists and electrical engineers.
Email:
Address:New York, United States
Pete Pupalaikis
Time Domain Method for Measurement of S-Parameters of Passive Devices
Biography:
Email:
Address:New York, United States
Alan Blankman, PhD.
Time Domain Method for Measurement of S-Parameters of Passive Devices
Biography:
Email:
Address:New York, United States