What's New in Digital Pre-Distortion

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What's New in Digital Pre-Distortion

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  • 16 Eagle Rock Avenue
  • E. Hanover, New Jersey
  • United States 07936
  • Building: Hanover Manor

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  • Co-sponsored by MTT/AP-S Chapter
  • Starts 25 June 2013 04:00 AM UTC
  • Ends 03 October 2013 12:00 PM UTC
  • No Admission Charge


  Speakers

Dr. John Wood

Topic:

What's New in Digital Pre-Distortion

Biography: John Wood received B.Sc. and Ph.D. degrees in Electrical and Electronic
Engineering from the University of Leeds, UK, in 1976 and 1980,
respectively. He is currently Senior Scientist in Maxim Labs at Maxim
Integrated Products, Inc, Sunnyvale, CA, where he is working on
Envelope Tracking and Digital Pre-Distortion systems for wireless
communications applications. He was formerly a Distinguished Member
of the Technical Staff responsible for RF System & Device Modeling in
the RF Division of Freescale Semiconductor, Inc, Tempe, AZ, USA. His
areas of expertise include the development of compact device models
and behavioural models for RF power transistors and ICs, and
linearization and pre-distortion of high-power amplifiers. To enable and
support these modeling requirements, he has been involved in the
specification of high power pulsed I-V-RF test systems, for
connectorized and on-wafer applications, and in the development of
large-signal network analyzer (LSNA), loadpull, and envelope
measurement techniques. From 1997-2005 he worked in the
Microwave Technology Center of Agilent Technologies(then Hewlett
Packard) in Santa Rosa, CA, USA, where his research work has included
the investigation, characterization, and development of large-signal and
bias-dependent linear FET models for millimetre-wave applications, and
nonlinear behavioural modeling using LSNA measurements and
nonlinear system identification techniques. Between 1983 and 1997 he
was a Professor in the Department of Electronics at the University of
York, UK, where his research and teaching interests covered
semiconductor devices, RF and microwave circuits, IC design, and
device modeling.
He has organized, co-organized, and presented at many workshops at
IMS and RWS in recent years; he was on the Steering Committee for IMS
2006, and has been a member of the IMS Technical Program Committee for
the past four years, currently Chair of SC-20 'High-Power Amplifiers'. He has
been a member of the ARFTG Executive Committee from 2007-10, was the
Technical Program Chair for the 70th & 75th ARFTG Conferences (2007,
2010), and the General Chair for the 78th ARFTG Conference in Fall 2011.
He was Technical Program Chair for the IEEE Power Amplifier Symposium
2008, 2010, and was General Chair in 2009 and 2011. He is a regular
reviewer for IEEE Transactions on Microwave Theory & Techniques, on
Electron Devices, and on Circuits & Systems. He is author or co-author of
over 120 papers and articles in the fields of microwave device and system
modeling and characterization, and microwave device technology. He is the
co-author of Modeling and Characterization of RF and Microwave Power FETs
(Cambridge, 2007), and co-editor of Fundamentals of Nonlinear Behavioral
Modeling for RF and Microwave Design (Artech House, 2005). He received
the ARFTG Technology Award in 2007. He is a Fellow of the IEEE, and a
member of the Microwave Theory and Techniques, and Electron Devices
Societies.

Address:United States