Nick of Intel

Moore’s law establishes that silicon transistor density will continue to shrink and/or devices will become smaller. Inevitably, PCB density will follow. Radios will continue to be closely located to both devices, their circuitry, and interconnects. The metrology of current test practices, use either probes or antennas that require manual or automated positioning and potentially have large uncertainties in the uniform field area. The metrology and methods proposed in C63.9 allow for a lower uncertainty of variation within the uniform field area helping designers avoid susceptibility of components, subsystems, and PCB layout sensitivities earlier in the design phase using the equipment found on a common EMC lab.

Biography:

Nick is a senior product regulation engineer in the Corporate Product Regulations and Standards department at Intel. He began his EMC career at Key Tronic in Spokane, WA in 1991 after a 3-month cross training activity in the EMC lab. His passion for Astronomy and RF engineering started at an early age. After an injury his father bought him a telescope to keep him busy during the summer. Shortly afterward he checked out an ARRL handbook from the local library determined to learn everything from Ohm’s law to wave propagation to antenna building. After graduating from Spokane Community College, he worked at Key Tronic for 13 years and for the last 27 he has been with Intel. Nick is an iNARTE certified EMC engineer, an IEEE EMCS member for 31 years and PSES member for 10 years, holds a Technician class amateur radio license and is a USEMC C63 Sub-Committee 5 Immunity WG member responsible for the overhaul of the C63.9 Standard.

Email:

Address:United States