Reliability Growth Test Planning and Data Analysis: What are the Real Final Results?

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Reliability growth of hardware through test and analysis has been a valuable industry tool for improvement of reliability of products for several decades. To provide a measure of this improvement, several mathematical models have been developed. This presentation will show how mathematical and also theoretical error in these models, unaddressed for decades, leads to incorrectly planned test duration and unrealistic overestimate of achieved reliability improvement.

There is no charge for the refreshments or presentation. You do not need to belong to the IEEE to attend this event; however, we welcome your consideration of IEEE membership as a career enhancing technical affiliation.

Please register to attend by Friday, January 8, so we can plan the refreshments.

Directions to 3 Forbes Road, Lexington, MA 02420:

• Take Route 128/I-95 to Exit 30B, Route 2A Westbound.
• At the first traffic light, turn left onto Forbes Road.
• Go to the end of the street.
• At the traffic circle, turn right.
• Go halfway around the traffic circle and turn into the parking lot for MIT Lincoln Laboratory.
• The main entrance is straight ahead, shared with "agenus".
• Have a government-issued photo ID, such as a driver's license.

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This meeting will be held on Wednesday, January 13, 2016 at 3 Forbes Road, Lexington, MA 02420.

5:30-6:00 PM: Sign in, refreshments, and personal networking
6:00-6:10 PM: Chapter Chair greetings and announcements
6:10-7:30 PM: Presentation
7:30-7:45 PM: Q&A session, meeting adjourns

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