EMC Professional Talk “Thin Film Near Field Absorbers in Specific EMI Environments” by Jeff Tostenrude (3M Company)
EMC Professional Talk
Speaker: Jeff Tostenrude (3M Company)
Title: Thin Film Near Field Absorbers in Specific EMI Environments
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Jeff Tostenrude of 3M Company
Thin Film Near Field Absorbers in Specific EMI Environments
In this work we utilize different electromagnetic interference (EMI) environments to test near field absorber performance as well as absorber placement. We use in-house designed test fixtures to mimic some of the real-world EMI environments: shield cans and metal shielding screens. The near field test results are compared to the reflection loss, one of the most used absorber metrics.
Biography:
Jeff Tostenrude is a Global Application Engineer at 3M with 28 years of experience in RF-related technologies and applications. Since joining 3M in 2017, he has been responsible for advancing application and product development for EMI management materials across telecom, consumer electronics, aerospace/defense, and other markets. Before joining 3M, Jeff worked at Ericsson in both the U.S. New Product Introduction team and the Product Development Unit in Sweden. Earlier in his career, he specialized in radio access network design and optimization for U.S. mobile network operators. A graduate of Washington State University, Jeff currently leads application development efforts for key accounts. Outside of his professional work, Jeff is an amateur radio operator holding an Amateur Extra license (K5UHF).