Microwave Microscopy of Micro/Nanoscale Material Properties
New generations of electronic and photonic devices are emerging that leverage the novel properties of low-dimensional and nanoscale materials. However, the successful application of such systems will require a detailed understanding of the interplay between the nanoscale structure and the associated electronic and optical properties. Scanning microwave microscopy (SMM) provides a powerful tool to study nanoscale electronic and magnetic properties in situ and non-destructively by directly probing local permittivity, conductivity and permeability variations with nanometer spatial resolution. In the talk we will discuss our work studying variations in properties in low-dimensional and thin film materials.
Date and Time
Location
Hosts
Registration
- Date: 08 Feb 2019
- Time: 11:00 AM to 12:15 PM
- All times are (GMT-07:00) US/Mountain
-
Add Event to Calendar
- 1420 Austin Bluffs Parkway
- Colorado Springs, Colorado
- United States 80918
- Building: Osborne
- Room Number: A204
- Contact Event Host
-
Zbigniew Celinski
Department of Physics
UCCS
- Co-sponsored by UCCS
Speakers
Pavel Kabos of NIST
Microwave Microscopy of Micro/Nanoscale Material Properties
New generations of electronic and photonic devices are emerging that leverage the novel properties of low-dimensional and nanoscale materials. However, the successful application of such systems will require a detailed understanding of the interplay between the nanoscale structure and the associated electronic and optical properties. Scanning microwave microscopy (SMM) provides a powerful tool to study nanoscale electronic and magnetic properties in situ and non-destructively by directly probing local permittivity, conductivity and permeability variations with nanometer spatial resolution. In the talk we will discuss our work studying variations in properties in low-dimensional and thin film materials.
Email:
Address:325 Broadway, , Boulder, Colorado, United States, 80305