Power Device Reliability Session at the 31st European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF)


This international symposium will continue its history of focusing on the latest research developments and future directions in failure analysis, quality and reliability of materials, devices and circuits for micro-, opto-, power and space electronics. It historically provides an unprecedented European forum to develop all aspects of reliability, including management and advanced analysis techniques for present- and emerging semiconductor applications. All aspects related to specification, technology and manufacturing, testing, control and analysis are addressed in ESREF.

  Date and Time




  • Start time: 04 Oct 2020 09:35 AM
  • End time: 08 Oct 2020 02:30 PM
  • All times are (UTC+01:00) Bern
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Virtual Conference. Session managed from Zurich, Switzerland.



Power Device Reliability

13 speakers and 5 posters