Power Device Reliability Session at the 31st European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF)

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This international symposium will continue its history of focusing on the latest research developments and future directions in failure analysis, quality and reliability of materials, devices and circuits for micro-, opto-, power and space electronics. It historically provides an unprecedented European forum to develop all aspects of reliability, including management and advanced analysis techniques for present- and emerging semiconductor applications. All aspects related to specification, technology and manufacturing, testing, control and analysis are addressed in ESREF.


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Topic:

Power Device Reliability

13 speakers and 5 posters