Power Device Reliability Session at the 31st European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF)

#Power #device #reliability

This international symposium will continue its history of focusing on the latest research developments and future directions in failure analysis, quality and reliability of materials, devices and circuits for micro-, opto-, power and space electronics. It historically provides an unprecedented European forum to develop all aspects of reliability, including management and advanced analysis techniques for present- and emerging semiconductor applications. All aspects related to specification, technology and manufacturing, testing, control and analysis are addressed in ESREF.