CASS-SCV Online Lecture: "Fault Tolerant Smart Power Drivers with Biasing Schemes and Diagnostics for Smart Automotive Systems," by Dr. Sri Navaneeth Easwaran on May 13th
"Fault Tolerant Smart Power Drivers with Biasing Schemes and Diagnostics for Smart Automotive Systems"
Dr. –Ing Sri Navaneeth Easwaran, Texas Instruments
Event Organized By:
Circuits and Systems Society (CASS) of the IEEE Santa Clara Valley Section
REGISTRATION LINK: here
PROGRAM:
6:55 - 7:00 PM Intro 7:00 - 7:50 PM Lecture7:50 - 8:00 PM Q&A/Adjourn
Abstract:
The electronic components are increasing in automotive applications replacing earlier mechanical and hydraulics solutions. With proper protection and diagnostics, we can ensure that these electronic components (power semiconductors/transistors) perform the expected function and achieve fail silent (fault tolerant) operation by sensing the fault and adapting its behavior. They also incorporate advanced and robust diagnostic circuits that provideinformation apriori for safety to the drivers/passengers in the cars about the load conditions, faults etc. Such components are referred to as the Smart Power Circuits. Their designs are not much different from the conventional analog circuits used in consumer electronics topology wise. However, they have to handle a wide range of input voltage (5V to 40V) and wide range of currents (30mA to 4A). There are additional system requirements and design implementation challenges that have to be considered when defining and implementing such circuits. This seminar/tutorial introduces the State-of-the-Art requirements of automotive ICs, design techniques, R-L-C type of loads, thermal simulations, reliability and explains the various Gate Drivers like the high side driver, low side driver configurable high side/low side drivers. Power supply sequencing, level shifters, charge pump, voltage-current selector circuits will be presented. High voltage, negative voltage tolerant switches for diagnostics and impact of on chip parasitic bipolar transistors in automotive applications are discussed.
Bio:
Dr. –Ing Sri Navaneeth Easwaran, Senior Member IEEE, received his Bachelor's (1998, Bharathidasan University), Master's (2006, University Twente) degrees in Electrical Engineering and Dr. –Ing. degree from University of ErlangenNuremberg in 2017. He worked at SPIC Electronics, STMicroelectronics, Philips Semiconductors between 1998 and 2006. From 2006 he is with Texas Instruments (TI) where he was the design lead for airbag squib driver ICs. He has also designed high voltage and -40V tolerant circuits for automotive ICs. He is an IET Fellow (since Feb 2021) and a TI Senior Member Technical Staff. He has 20+ granted patents and 15 publications. He has offered tutorials on Automotive design at IEEE Conferences.
Zoom Broadcast:
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Topic: Amit Jha's Zoom Meeting
Time: May 13, 2021 07:00 PM Pacific Time (US and Canada)
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Date and Time
Location
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Registration
- Date: 13 May 2021
- Time: 07:00 PM to 08:00 PM
- All times are (UTC-07:00) Pacific Time (US & Canada)
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- Santa Clara, California
- United States
Speakers
Dr. Sri Navaneeth Easwaran
Fault Tolerant Smart Power Drivers with Biasing Schemes and Diagnostics for Smart Automotive Systems
Abstract:
The electronic components are increasing in automotive applications replacing earlier mechanical and hydraulics solutions. With proper protection and diagnostics, we can ensure that these electronic components (power semiconductors/transistors) perform the expected function and achieve fail silent (fault tolerant) operation by sensing the fault and adapting its behavior. They also incorporate advanced and robust diagnostic circuits that provideinformation apriori for safety to the drivers/passengers in the cars about the load conditions, faults etc. Such components are referred to as the Smart Power Circuits. Their designs are not much different from the conventional analog circuits used in consumer electronics topology wise. However, they have to handle a wide range of input voltage (5V to 40V) and wide range of currents (30mA to 4A). There are additional system requirements and design implementation challenges that have to be considered when defining and implementing such circuits. This seminar/tutorial introduces the State-of-the-Art requirements of automotive ICs, design techniques, R-L-C type of loads, thermal simulations, reliability and explains the various Gate Drivers like the high side driver, low side driver configurable high side/low side drivers. Power supply sequencing, level shifters, charge pump, voltage-current selector circuits will be presented. High voltage, negative voltage tolerant switches for diagnostics and impact of on chip parasitic bipolar transistors in automotive applications are discussed.
Biography:
Dr. –Ing Sri Navaneeth Easwaran, Senior Member IEEE, received his Bachelor's (1998, Bharathidasan University), Master's (2006, University Twente) degrees in Electrical Engineering and Dr. –Ing. degree from University of ErlangenNuremberg in 2017. He worked at SPIC Electronics, STMicroelectronics, Philips Semiconductors between 1998 and 2006. From 2006 he is with Texas Instruments (TI) where he was the design lead for airbag squib driver ICs. He has also designed high voltage and -40V tolerant circuits for automotive ICs. He is an IET Fellow (since Feb 2021) and a TI Senior Member Technical Staff. He has 20+ granted patents and 15 publications. He has offered tutorials on Automotive design at IEEE Conferences.
Agenda
"Fault Tolerant Smart Power Drivers with Biasing Schemes and Diagnostics for Smart Automotive Systems"
Dr. –Ing Sri Navaneeth Easwaran, Texas Instruments
Event Organized By:
Circuits and Systems Society (CASS) of the IEEE Santa Clara Valley Section
PROGRAM:
6:55 - 7:00 PM Intro 7:00 - 7:50 PM Lecture7:50 - 8:00 PM Q&A/Adjourn
Abstract:
The electronic components are increasing in automotive applications replacing earlier mechanical and hydraulics solutions. With proper protection and diagnostics, we can ensure that these electronic components (power semiconductors/transistors) perform the expected function and achieve fail silent (fault tolerant) operation by sensing the fault and adapting its behavior. They also incorporate advanced and robust diagnostic circuits that provideinformation apriori for safety to the drivers/passengers in the cars about the load conditions, faults etc. Such components are referred to as the Smart Power Circuits. Their designs are not much different from the conventional analog circuits used in consumer electronics topology wise. However, they have to handle a wide range of input voltage (5V to 40V) and wide range of currents (30mA to 4A). There are additional system requirements and design implementation challenges that have to be considered when defining and implementing such circuits. This seminar/tutorial introduces the State-of-the-Art requirements of automotive ICs, design techniques, R-L-C type of loads, thermal simulations, reliability and explains the various Gate Drivers like the high side driver, low side driver configurable high side/low side drivers. Power supply sequencing, level shifters, charge pump, voltage-current selector circuits will be presented. High voltage, negative voltage tolerant switches for diagnostics and impact of on chip parasitic bipolar transistors in automotive applications are discussed.
Bio:
Dr. –Ing Sri Navaneeth Easwaran, Senior Member IEEE, received his Bachelor's (1998, Bharathidasan University), Master's (2006, University Twente) degrees in Electrical Engineering and Dr. –Ing. degree from University of ErlangenNuremberg in 2017. He worked at SPIC Electronics, STMicroelectronics, Philips Semiconductors between 1998 and 2006. From 2006 he is with Texas Instruments (TI) where he was the design lead for airbag squib driver ICs. He has also designed high voltage and -40V tolerant circuits for automotive ICs. He is an IET Fellow (since Feb 2021) and a TI Senior Member Technical Staff. He has 20+ granted patents and 15 publications. He has offered tutorials on Automotive design at IEEE Conferences.
Zoom Broadcast:
Amit Jha is inviting you to a scheduled Zoom meeting.
Topic: Amit Jha's Zoom Meeting
Time: May 13, 2021 07:00 PM Pacific Time (US and Canada)
Join Zoom Meeting
https://us02web.zoom.us/j/89090589374?pwd=bG5uT2FuWGc1Q3lOVXJMUUZ2QnJGdz09
Meeting ID: 890 9058 9374
Passcode: 315340
One tap mobile
+12532158782,,89090589374#,,,,*315340# US (Tacoma)
+13462487799,,89090589374#,,,,*315340# US (Houston)
Dial by your location
+1 253 215 8782 US (Tacoma)
+1 346 248 7799 US (Houston)
+1 669 900 6833 US (San Jose)
+1 312 626 6799 US (Chicago)
+1 929 436 2866 US (New York)
+1 301 715 8592 US (Washington DC)
Meeting ID: 890 9058 9374
Passcode: 315340
Find your local number: https://us02web.zoom.us/u/keiRzTDt6Q
Admission Fee:
All admissions free. Suggested donations:
Non-IEEE: $5, Students (non-IEEE): $3, IEEE Members (not members of CASS or SSCS): $3