Inside Microwave Measurements with Dr. Jon Martens

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June 30th Technical Meeting -- Inside Microwave Measurements


On June 30th the AP/MTT and ED/CAS Chapters of the IEEE Foothill Section are hosting the Distinguished Microwave Lecture:

What is My Measurement Equipment Actually Doing? Implications for 5G

Presented by Dr. Jon Martens, Engineering Fellow at Anritsu.

As broadband microwave measurements become more prevalent in the 100+ GHz range, the limitations and challenges related to nonlinearities, dynamic range, calibration, and processing algorithms become topics that uW and mmW engineers must better understand. This presentation shall discuss many of the "under the hood" tasks taking place in microwave instrumentation, giving insights and understanding into measurement sensitivities and potential anomalies.

Please join us for this revealing and informative presentation.



  Date and Time

  Location

  Hosts

  Registration



  • Date: 30 Jun 2021
  • Time: 06:30 PM to 08:00 PM
  • All times are US/Pacific
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This will be a virtual meeting.
Please register to receive meeting URL information.

Foothill Section Reference Location:

  • Ontario, California
  • United States 91764

  • Scott Wedge, Ph.D.
    Chair 
    Osman Ceylan, Ph.D.
    Vice Chair
    AP/MTT & ED/CAS Chapters
    IEEE Foothill Section

  • Co-sponsored by IEEE Foothill Section
  • Starts 14 May 2021 12:00 PM
  • Ends 30 June 2021 05:00 PM
  • All times are US/Pacific
  • No Admission Charge


  Speakers

Dr. Jon Martens

Dr. Jon Martens

Topic:

What is My Measurement Equipment Actually Doing? Implications for 5G

Current microwave and high frequency instrumentation perform many tasks behind the scenes, even more so in the mm-wave and high modulation rate regimes, and it is easy to lose track of how the equipment, the processing algorithms, the setup and the signals are interacting. By exploring the measurement mechanics within some common instruments under practical conditions, it may be easier to understand where sensitivities or anomalies might increase and how to mitigate them.  Through a study of example architectures and measurements, including those in the 100+ GHz range and those with wide modulation bandwidths where linearity, dynamic range and other physical metrics are stressed even more, mechanisms and ideas for better measurements will be explored.

Biography:

Jon Martens received the BSEE, MSEE and Ph.D. in Electrical Engineering from the University of Wisconsin in 1986, 1988 and 1990, respectively. Since 1995, he has been with Anritsu where he is currently an Engineering Fellow. His research interests include measurement system architectures, millimeter-wave circuit and system design, and a wide range of microwave measurement processes to include materials analysis, nonlinear and quasi-linear characterization, optical interactions, and calibration. He is the inventor or co-inventor on over 17 patents, has (co-)authored several book chapters and over 50 technical publications. Dr. Martens is a past chair of the MTT measurements technical subcommittee and is a past president of the measurements society ARFTG and is still active in both. He is a member of the technical program subcommittees for the International Microwave Symposium and ARFTG and is a former associate editor for the Transactions on Microwave Theory and Techniques.





Agenda

6:30-7:00PM : Networking and Introductions

7:00-7:45PM : Technical Presentation by Dr. Jon Martens

7:45-8:00PM : Questions and Closing Remarks



June 30th Technical Meeting -- Inside Microwave Measurements