What is my measurement equipment actually doing? Implications for 5G/6G, mm-wave and related applications
Jon Martens, Anritsu
IEEE MTT Distinguished Microwave Lecturer
Abstract - Current microwave and high frequency instrumentation perform many tasks behind the scenes, even more so in the mm-wave and high modulation rate regimes that are critical for new communications, imaging, and related application, and it is easy to lose track of how the equipment, the processing algorithms, the setup and the signals are interacting. By exploring the measurement mechanics within some common instruments under practical conditions, it may be easier to understand where sensitivities or anomalies might increase, how to mitigate them and how the hardware has been evolving. Through a study of example architectures and measurements, including those in the 100+ GHz range and those with wide modulation bandwidths where linearity, dynamic range and other physical metrics are stressed even more, mechanisms and ideas for better measurements will be explored.
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- Date: 19 Nov 2021
- Time: 03:00 PM to 04:50 PM
- All times are (GMT-08:00) America/Vancouver
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- Vancouver, British Columbia
- Canada V6T 1Z4
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- Starts 12 November 2021 09:51 AM
- Ends 19 November 2021 02:51 PM
- All times are (GMT-08:00) America/Vancouver
- No Admission Charge
Speakers
Jon Martens
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