Selection, characterization and de-embedding of differential probes for accurate measurements of high-speed PCB signal structures

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IEEE North Jersey Section MTT/AP Chapter Co-Sponsors the event


This webinar addresses the key aspects for making accurate measurements with differential probes on high-speed PCB signal structures: The selection of the right probe and the characterization of this probe, so that it can be completely de-embedded from the measurement result. This also includes the discontinuity at the contact area between probe tips and measured PCB structure. It is caused by the probing and is not part of the PCB structure. For accurate results, this discontinuity also needs to be characterized and removed from the measurement results. In this webinar, we demonstrate the measurements and compare the results, when just de-embedding the probe tips and when correctly also removing this discontinuity. In this webinar, the speaker will start with some typical use cases for measurements with differential probes, introduce the concept of test fixture characterization and de-embedding, and the particular challenges and solutions for accurate measurements with differential probes. We also discuss the specifics of differential probes and their advantages. By reference to practical measurements of a differential trace on a test board, we will explain the steps required to obtain the best measurement results.

  • Please click the link for registration for attending the webinar: REGISTER 


  Date and Time

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  • Date: 14 Dec 2022
  • Time: 01:00 PM to 02:00 PM
  • All times are (GMT-05:00) US/Eastern
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  • Contact Event Hosts
  • Ajay Poddar (akpoddar@ieee.org), Edip Niver (edip.niver@njit.edu), Anisha Apte (anisha_apte@ieee.org)

  • Co-sponsored by IEEE North Jersey Section


  Speakers

Brian Shumaker Brian Shumaker of DVT Solutions

Topic:

Selection, characterization and de-embedding of differential probes for accurate measurements of high-speed PCB signal s

This webinar addresses the key aspects for making accurate measurements with differential probes on high-speed PCB signal structures: The selection of the right probe and the characterization of this probe so that it can be completely de-embedded from the measurement result. This also includes the discontinuity at the contact area between probe tips and measured PCB structure. It is caused by the probing and is not part of the PCB structure. For accurate results, this discontinuity also needs to be characterized and removed from the measurement results. In this webinar, we demonstrate the measurements and compare the results, when just de-embedding the probe tips and when correctly also removing this discontinuity. In this webinar, the speaker will start with some typical use cases for measurements with differential probes, introduce the concept of test fixture characterization and de-embedding, and the particular challenges and solutions for accurate measurements with differential probes. We also discuss the specifics of differential probes and their advantages. By reference to practical measurements of a differential trace on a test board, we will explain the steps required to obtain the best measurement results.

Biography:

Brian Shumaker, the founder, and CEO of DVT Solutions is the inventor of the only true differential probe. He consults with premier Silicon Valley companies to develop test and measurement solutions that research engineers use with his probes to verify their prototypes against product designs. Brian also works with companies world-wide to provide training in advanced test and measurement techniques.

Address:DVT Solutions, LLC, , California, United States





Agenda

  • Please click the link for registration for attending the webinar: REGISTER