IEEE-Ansys Electronics Reliability Validation Testing Series - Accelerated Life Testing for Electronics Reliability

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Whether in the defense, healthcare, consumer electronics, or communication industries, performing electronic packaging reliability demonstration tests is a crucial part of the design process. This webinar will cover a wide range of accelerated life tests (ALT), including ALT tests at the device level to determine characteristic life, highly accelerated life tests (HALT) to determine design flaws, highly accelerated stress screens (HASS) to catch manufacturing defects, and board level reliability tests (BLTR) to demonstrate product reliability. The discussion of each test will include a definition of the test, recommendations on how to design and complete the test, and how to process the results. The lecture is focused on electronics reliability and will use electronics examples to aid in the discussion.

This presentation is the second part of a two-lecture miniseries covering electronics reliability validation testing. The previous lecture focused on developing a fundamental background of electronics failures. This lecture will focus on using those fundamentals to develop validation tests based.

TAKEAWAYS:

• How to use accelerated life testing to predict product life in the field.
• Understanding the differences between the different ALT test – ALT/HALT/HASS/BLRT
• How to develop a reliability demonstration test.

We can offer Continuing Education Units (CEU) and Professional Development Hours (PDH), if requested.