IEEE Fall Seminar Series
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Abhishek Saini presents his work on Defect characterization using ultrasound - ray-based to wavefield based approach
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Abhishek Saini of MPA-11
Topic:
Defect characterization using ultrasound - ray-based to wavefield based approach
Biography:
Abhishek Saini completed his PhD in 2021 from Nanyang Technological University Singapore. He worked as a Postdoc Research Associate with RollsRoyce@NTU corporate lab before joining Los Alamos National Lab in December 2022. His research interest includes ultrasonic imaging and inversion, wave propagation and acoustic metamaterials. Recently, his interest also inclined towards applied machine learning for acoustics and ultrasound.
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Address:PO 1663, , Los Alamos, United States, 87545
John Greenhall of LANL
Topic:
Ultrasound directed self-assembly for manipulating, organizing, and concentrating micro and nanoparticles
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