Hybrid Event- Complex Electronics Reliability and Life Modeling Based on Physics of failure Simulation

#Reliability #IEEE #Boston #Chapter #electronics
Share

Sponsor:   IEEE Boston/Providence/New Hampshire Reliability Chapter

                Please visit https://r1.ieee.org/boston-rl/

Host:        IEEE Boston/Providence/New Hampshire Reliability Chapter


Complex electronics systems and components are subject to various stressors and uncertainties that can affect their reliability and performance over time. Traditional reliability assessment methods, such as statistical models, MTBF estimations, and testing, may not be able to capture the complex interactions and dependencies among the system elements and the failure mechanisms. Physics of failure is an alternative approach that uses physics-based modeling and simulation to understand the root causes of failure, such as device degradation, fatigue, fracture, wear, and corrosion, and to predict the system reliability and life expectancy under different operating conditions and environments. It can also estimate the remaining useful life and the state of degradation of the system. Physics of failure can also incorporate probabilistic methods to account for the uncertainties and variabilities in the system parameters, materials properties, loading conditions, and failure mechanisms. In this presentation, we will present the foundation and methods of physics of failure-based tools for reliability modeling of complex electronics systems and components and demonstrate how they can be applied to various domains. We will also discuss the advantages and limitations of the physics of failure-based reliability modeling and compare it with other reliability assessment methods. The capabilities of Ansys Sherlock will be demonstrated for electronics physics of failure.



  Date and Time

  Location

  Hosts

  Registration



  • Date: 13 Dec 2023
  • Time: 05:00 PM to 07:30 PM
  • All times are (UTC-05:00) Eastern Time (US & Canada)
  • Add_To_Calendar_icon Add Event to Calendar

This Meeting is to be delivered in-person at MIT Lincoln Lab Main Cafeteria, 244 Wood St, Lexington, MA 02421, and virtually.

At registration, you must provide a valid e-mail address to receive the Webinar Session link approximately 15 hours before the event.  The link will only be sent to the e-mail address entered with your registration.  Please double-check for spelling errors.  If you haven't received the e-mail as scheduled, please check your spam folder and alternate e-mail accounts before contacting the host.

Please indicate in the registration survey if you will be attending in person so that we may plan for food and refreshments.

  • Lincoln Laboratory
  • 244 Wood St
  • Lexington, MA 02421, Massachusetts
  • United States
  • Building: Main Cafeteria

  • Contact Event Host
  • Michael W. Bannan, Chair

    IEEE Boston/Providence/New Hampshire Reliability Chapter

  • Starts 19 November 2023 01:00 AM
  • Ends 11 December 2023 05:30 PM
  • All times are (UTC-05:00) Eastern Time (US & Canada)
  • No Admission Charge
  • Menu: Dietary Restrictions (please note in survey answers)


  Speakers

Mohammad Pourgol Mohammad Pourgol of Teradyne

Topic:

Complex Electronics Reliability and Life Modeling Based on Physics of failure Simulation

Complex electronics systems and components are subject to various stressors and uncertainties that can affect their reliability and performance over time. Traditional reliability assessment methods, such as statistical models, MTBF estimations, and testing, may not be able to capture the complex interactions and dependencies among the system elements and the failure mechanisms. Physics of failure is an alternative approach that uses physics-based modeling and simulation to understand the root causes of failure, such as device degradation, fatigue, fracture, wear, and corrosion, and to predict the system reliability and life expectancy under different operating conditions and environments. It can also estimate the remaining useful life and the state of degradation of the system. Physics of failure can also incorporate probabilistic methods to account for the uncertainties and variabilities in the system parameters, materials properties, loading conditions, and failure mechanisms. In this presentation, we will present the foundation and methods of physics of failure-based tools for reliability modeling of complex electronics systems and components and demonstrate how they can be applied to various domains. We will also discuss the advantages and limitations of the physics of failure-based reliability modeling and compare it with other reliability assessment methods. The capabilities of Ansys Sherlock will be demonstrated for electronics physics of failure.

Biography:

Dr. Mohammad Pourgol is a safety/reliability analyst in multidisciplinary systems analysis with Teradyne and an Associate Professor (adj) of Mechanical engineering at the University of Maryland. He previously held the position of Associate Professor of Reliability Engineering at Sahand University of Technology (SUT). Dr. Pourgol earned his Ph.D. in Reliability Engineering from the University of Maryland (UMD). With over 20 years of work experience, his career includes industrial application, research, and teaching in safety applications and reliability engineering at various institutions, including Teradyne Semiconductor, Johnson Controls, Sahand University of Technology, FM Global, Daikin Comforts, UMD, Massachusetts Institute of Technology (MIT). Dr. Pourgol is an IEEE Senior Member, an elected ASQ Fellow, and ASME Fellow. He also served as the ASME Safety Engineering and Risk/Reliability Analysis Division (SERAD) Chair from 2017 to 2022. Additionally, he is a registered Professional Engineer (PE) in the State of Massachusetts and holds certifications as a reliability engineer (ASQ CRE), Six Sigma Black Belt (CSSBB), and Manager of Quality/Organization Excellence (ASQ CMQ/OE). Dr. Pourgol has authored over 160 papers in archival journals and peer-reviewed conferences on his research and has been an invited/Keynote Speaker at numerous conferences and webinars. He has also filed one US patent, and his efforts have been recognized with several awards. Currently, Dr. Pourgol serves as the Associate Editor for the ASME-ASCE Journal of Risk and Uncertainty in Engineering Systems, both Part A: Civil Engineering and Part B: Mechanical Engineering.





Agenda

5:00 PM     Networking

5:30 PM   Technical Presentation

7:15 PM   Questions and Answers

7:30 PM   Adjournment



The meeting is open to all.  You do not need to belong to the IEEE to attend this event; however, we welcome your consideration of IEEE membership as a career enhancing technical affiliation.

There is no cost to register or attend, but registration is required.

For in-person attendees, masks are optional.  Please feel free to wear one if you wish!