Making sure your IC works when you buy it: Integrated Circuit Testing and the International Test Conference

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Making sure your IC works when you buy it: Integrated Circuit Testing and the International Test Conference

Testing integrated circuits and systems for defects has never been trivial.  Exhaustive testing is impossible, and test economics require testing to be fast and effective.  This talk will discuss some of the work that engineers have done over the years to help minimize test escapes and reduce the odds that customers end up with defective devices.  It will then cover some of the issues at the cutting edge of test today, and why they get so much attention at the International Test Conference.


  Date and Time

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  • Date: 21 Jan 2025
  • Time: 07:00 PM to 08:00 PM
  • All times are (GMT-05:00) US/Eastern
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  • Starts 18 December 2024 12:00 AM
  • Ends 21 January 2025 12:00 PM
  • All times are (GMT-05:00) US/Eastern
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  Speakers

Jennifer Dworak of Southern Methodist University

Topic:

Making sure your IC works when you buy it: Integrated Circuit Testing and the International Test Conference

Biography:

Jennifer Lynn Dworak is a Professor in the Department of Electrical and Computer Engineering at Southern Methodist University and the Associate Director for the AT&T Center for Virtualization. Her research interests include manufacturing test, the reliability of digital circuits and systems, and hardware security.  She is an author on multiple technical articles, including two papers that won a Best Paper Award from the VLSI Test Symposium and a paper that won a TTTC Naveena Nagi Award. 

Address:United States




Agenda

WEBINAR: 7:00 - 8:00 P.M. 

The Zoom Webinar link and password will be forwarded to all registered participants after Noon on the day of the meeting. Check your spam folder if you don't see the email. 

Webinar is open to all.

PDH certificates are available and an evaluation form will be emailed to you after the meeting. PDH certificate are sent by IEEE USA 3-4 weeks after the meeting.