Statistical Process Control for an EMC Laboratory + Meet the Chapter Angel
Measurement system variability in a test laboratory can be a source of discomfort for the test engineer, the designer and management. This is especially true in product development laboratories where the question of exactly what effect a design change had on system behavior is of central interest. The use of Statistical Process Control (SPC) methods to gage and track the variability of system measurements can provide confidence in the repeatability of the system setup, and in the data it produces.
However, the use of SPC in an EMC Lab, especially for frequency domain measurements, requires decisions to limit the quantity of the data to avoid information overload. To accomplish this careful selection of the measurement methods is essential.
In addition to the above topic, a brief presdnetation will be given on Life and Time Management - looking back on 75 years of life, and some suggestions on how to use time and planning to achieve the goals you select and work toward.
Date and Time
Location
Hosts
Registration
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- 1095 6th Ave.
- Marion, Iowa
- United States 52302-3428
- Building: Marion Public Library
- Room Number: Large conference room
- Click here for Map
- Contact Event Host
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Phone: (319) 462-5984
Cell: (319) 480-1674
Fax: (319) 462-5996
- Starts 11 May 2017 05:00 PM UTC
- Ends 30 May 2017 11:00 PM UTC
- Admission fee (optional) ?
Speakers
KIMBALL WILLIAMS of IEEE EMC Society
Statistical Process Control (SPC) for an EMC Laboratory + Life and Time Management
This will be a two part presentation, with the main one being the technical discussion of SPC in an EMC laboratory environment. In addition, Kimball is the EMC Society Chapter Angel for the Cedar Rapids chapter and this will be an opportunity for chapter members to meet him and discuss their interests and career needs with an experienced industrry veteran. Kimball's trip is being sponsored by the EMC Society Board of Directors, so any feedback and input that attendees provide can be used to improve programs and services of the EMC-S to you, the members.
Biography:
Kimball Williams completed his career and retired from DENSO as a “Technical Fellow” in 2012 after managing the DENSO EMC Test Laboratory. He is an iNARTE certified Master EMC Design Engineer, EMC Test Engineer and ESD Test Engineer with Lifetime certification from iNARTE.
Kim is also an IEEE Senior Life Member and Past Chair of the IEEE Southeastern Michigan Section and an ‘Honored Member’ of the IEEE EMC Society where he serves as one of the Past Presidents Emeritus and current Director of Professional Activities.
Kim is a licensed private pilot, PADDY certified scuba diver, licensed amateur radio operator (Call sign: N8FNC) and plays classical guitar in his ‘spare’ time.
Email:
Address:Dearborn, United States
KIMBALL WILLIAMS of IEEE EMC Society
Statistical Process Control (SPC) for an EMC Laboratory + Life and Time Management
Biography:
Email:
Address:Dearborn, United States
KIMBALL WILLIAMS of IEEE EMC Society
Statistical Process Control (SPC) for an EMC Laboratory + Life and Time Management
Biography:
Email:
Address:Dearborn, United States
Agenda
5:00 PM – Registration and networking, pizza and sodas/bottled water available
5:45 PM – EMC-S Chapter business meeting (we have some important issues to discuss)
6:00 PM – Start of Presentation