IEEE EMC-S RO no 1/2025 "Inauguration E-INFRA EMC Cluj-Napoca Laboratory and Technical Lectures"
#electromagnetic
#compatibility
#emc
#Engineering
#region-8
IEEE EMC Society in Region 8, Krzysztof Sieczkarek, IEEE EMC-S BoG, Region 8 Coordinator, Poland Chapter Chair, Poland
Technical Tour of E-INFRA EMC Laboratory
The Opportunity of Electromagnetic Compatibility Analyses in Strategic Projects with Regional Impact, Gianina Pelea, E-INFRA, Romania
The News from EMC Measurements, Lukasz Wilk, ALBATROSS PROJECTS, Germany
Latest Developments in the EMC Test and Measurements, Balasz Nagy, ROHDE & SCHWARZ, Hungary
Simulation of Conducted Emissions Using CST Studio Suite, Radu Voina, KEYTEK INNOVATION, Romania
Your All-in-One Solution for T&M and EMC Challenges, Andrei Serbanescu, ROMTEK ELECTRONICS, Romania
Test Solutions for E-Vehicles and Chargers, Mihai Mitarca, AMETEK CTS, Germany
Practical Use of Near Field Scanning to Troubleshoot Electromagnetic Interference of Devices, Krzysztof Mazur, PENDULUM INSTRUMENTS, Poland
Date and Time
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Technical University of Cluj-Napoca
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Cluj-Napoca, Cluj
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Romania
407714
Agenda
10:00- 10:30 Welcome of participants
10:30- 11:30 OFFICIAL CEREMONY
Prof. Vasile Topa Rector of TUCN, Head of NUMELEC Research Center
Dr. Teofil Muresan Founder and CEO E-INFRA
Dr. Andrei Marinescu Founder of ACER, Co-Founder of IEEE EMC-S RO Chapter
Dr. Krzysztof Sieczkarek IEEE EMC-S Board of Governors and Region 8 Coordinator
Prof. Calin Munteanu Head of EMC E-INFRA Lab, Chair of IEEE EMC-S RO Chapter
11:30- 12:00 Coffee break
TUCN, 71-73 Dorobantilor str, Cluj- Napoca
13:00- 14:00 VISIT of the EMC E-INFRA LABORATORY
14:00- 14:30 Cocktail
14:30- 17:00 EMC LATEST TECHNOLOGY PRESENTATIONS
14:30 - 14:50 The Opportunity of Electromagnetic Compatibility Analyses in Strategic Projects with Regional Impact, Gianina Pelea, E-INFRA, Romania
14:50 - 15:10 The News from EMC Measurements, Lukasz Wilk, ALBATROSS PROJECTS, Germany
15:10 - 15:30 Latest Developments in the EMC Test and Measurements, Balasz Nagy, ROHDE & SCHWARZ, Hungary
15:30 - 15:40 Coffee Break
15:40 - 16:00 Simulation of Conducted Emissions Using CST Studio Suite, Radu Voina, KEYTEK INNOVATION, Romania
16:00 - 16:20 Your All-in-One Solution for T&M and EMC Challenges, Andrei Serbanescu, ROMTEK ELECTRONICS, Romania
16:20 - 16:40 Test Solutions for E-Vehicles and Chargers, Mihai Mitarca, AMETEK CTS, Germany
16:40 - 17:00 Practical Use of Near Field Scanning to Troubleshoot Electromagnetic Interference of Devices, Krzysztof Mazur, PENDULUM INSTRUMENTS, Poland
