Advances in Vertical Wire Technology for Wire Bond Applications
-- wire bonding, advantages, pitch, footprint, vertical wires, SiP, RF, shielding, design rules ...
Advances in smart response-based processes have significantly improved wire bond reliability and further strengthened the use of the technology in high-volume manufacturing (HVM). Wire bonding technology remains a staple choice in vast majority of semiconductor packages due to its low cost, increased flexibility, and high yield rate. A traditional wire bond process consists of a wire loop with a ball bond on die and a wedge bond on substrate. Vertical Wires are an emerging interconnect solution formed using a unique process on the same ball bond equipment. Vertical Wires can be used as an alternative to the traditional wire bond processes or in conjunction with the traditional wire loops in SiPs. Although initially developed for interconnection applications, Vertical Wire technology was introduced in HVM for EMI shielding in SiP and RF packages. This presentation will detail new advances in Vertical Wire Technology to further reduce wire pitch, increase I/O density, and reduce package footprint. An overview of application range, capability and design rules for the technology will be discussed.
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Basil Milton
Biography:
Basil Milton is the global head of wire bond process development at Kulicke & Soffa based in Fort Washington, Pennsylvania. Basil has 17+ years of experience in developing improved wire bond processes to meet the needs of next generation semiconductor packages. Recently, his work has been focused on advancing vertical wire technology for wire bond applications and achieving greater synergies between wire bonding processes and data analytics to enable Industry 4.0. Basil has co-authored over 16 publications and has been awarded 6 US patents. He earned his B.S. & M.S. degrees in Mechanical Engineering from Drexel University in Philadelphia, PA and an MBA from The Pennsylvania State University.
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