Precision mm-Wave Test Fixtures for 400Gbps Serial PHY Characterization
This session provides a technical overview of tradeoffs in the use of precision, multi-lane millimeter-wave test fixtures for empirical characterization of 200G and 400G silicon SerDes. Measurement data from 67 GHz and 110 GHz channel emulators are analyzed, with emphasis on the impact of higher order modes in coaxial test cables relative to 200G and 400G Nyquist frequencies. For 224G SerDes, results demonstrate the ability to trade test cable loss at Nyquist against modal bandwidth, maintaining at least 20% BW margin. The discussion extends to candidate signaling strategies for 400G, evaluating whether these trends persist as modulation formats and channel requirements evolve. The findings inform the design and validation of next-generation serial PHYs, highlighting physical layer constraints and opportunities for advancing high-speed data center interconnects.
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- Starts 08 October 2025 04:00 AM UTC
- Ends 06 November 2025 07:00 PM UTC
- No Admission Charge
Speakers
Andrew Josephson of Samtec
Biography:
Andrew Josephson is a Signal Integrity Technologist with Samtec, focusing on the development, maturation, and standardization of emerging data rate interface technologies. He was previously a Distinguished Member of the Technical Staff at General Dynamics, where he contributed to mission-critical embedded computing solutions for HPC systems and airborne platforms. His experience includes electromagnetic environmental effects (E3), RF radiation hazard analysis, modeling, and spectrum site surveying on Naval ships. Most recently, Andrew has been contributing in a hybrid capacity by developing mm-wave test fixtures for multi-lane SerDes channel emulators, enabling scalable, configurable, and high-fidelity signal integrity validation at extreme data rates.