Lunch & Learn with Rohde & Schwarz!
Join us for a Lunch & Learn at INRS with Rohde & Schwarz!
Discover key techniques for testing RF and microwave components using state-of-the-art Rohde & Schwarz measurement equipment. This session will cover fundamental and advanced concepts useful for students, researchers, and engineers working in wireless systems, electronics, and signal processing.
Program
10:00 – 12:00 — Core RF Measurement Topics
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VNA architectures and measurements
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Calibration methods
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De-embedding techniques
12:00 – 13:30 — Lunch Break
13:30 – 15:30 — Advanced Applications
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Nonlinear amplifier measurements
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Noise figure measurements with a VNA
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Signal integrity applications
Don't miss this opportunity to learn from industry experts and explore cutting-edge test solutions!
Event Highlights:
- Attendees will get access to a free course material
- Technical presentations by Rohde & Schwarz
- Open discussions on future wireless communication trends
Who should attend:
- Graduate and undergraduate students in Electrical, Computer, Software Engineering.
- Faculty and researchers working in electronics, wireless communication, RF, and signal processing
- Anyone interested in cutting-edge communication technologies and measurement solutions
Date and Time
Location
Hosts
Registration
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Add Event to Calendar
- INRS, 800, De La Gauchetière Ouest
- Montreal, Quebec
- Canada H5A 1K6
- Building: Bureau 6900
- Room Number: 18
- Contact Event Hosts
- Co-sponsored by Staracom, INRS
- Starts 03 December 2025 05:00 AM UTC
- Ends 05 December 2025 03:00 PM UTC
- No Admission Charge
Speakers
Anis Ben Arfi of Rohde & Schwarz Canada
Biography:
Dr. Anis Ben Arfi received his PhD from the University of Calgary in 2019 and currently works at Rohde & Schwarz Canada, where he focuses on test equipment for Wireless Systems and signal processing.
He has been involved in IEEE since 2013. He found his passion while volunteering with the IEEE MTT-S and he is currently serving as the IEEE MTT-S Young Professionals vice-chair.
Edmond Zauner of Rohde & Schwarz Canada
Biography:
Edmond Zauner has been involved in RF and Microwave Test and Measurement and circuit/EM simulation in Canada since 1983. Specializing in Vector Network analysis, Spectrum Analysis and Phase noise measurements. Working at several major instrumentation solution providers as application specialist and senior subject matter expert. Edmond has a bachelor’s in electrical engineering and MBA from McGill University.