IEEE EDS Webinar: A device to circuit framework for BTI, HCD aging

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Webinar EDS SCV/SF event, Topic: "A device to circuit framework for BTI, HCD aging ", Presenter: Dr. Souvik Mahapatra

"A device to circuit framework for BTI, HCD aging" Lecture by Dr. Souvik Mahapatra

 

The Electron Devices Society Santa Clara Valley/San Francisco joint Chapter is hosting Dr. Souvik Mahapatra.

 

When: Friday, March 20th, 2026 – 11:45AM to 1:15PM (PDT)

11:45AM - 12PM: Introduction

12PM-12:45PM: Lecture

12:45PM-12:55PM: Q&A

1PM Adjourn

Where: Zoom

This is an online event ONLY and attendees can participate via Zoom. The Zoom meeting link will be sent a few days before the event to registered attendees.

Contact: ieeescveds at gmail.com

 

Speaker: Dr. Souvik Mahapatra

Abstract:

The benefit of performance gain per power is shrinking at advanced technology nodes. Several factors are responsible for this - including increased thermals, parasitics and aging issues. The traditional approach of treating aging as an afterthought with blanket guardbanding requires careful attention. In this talk we will propose a physics based device aging framework and its implementation in a circuit aging simulation platform. The framework can handle circuit aging under actual mission profiles (input activity and turbo-throttle conditions). Several possible approaches towards realistic / functional input based aging aware design modifications will be explored.



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IEEE EDS Webinar: A device to circuit framework for BTI, HCD aging

Biography:

Souvik Mahapatra is a professor of electrical engineering at IIT Bombay and co Founder of Relsym. His area of interest is reliability of CMOS devices and circuits and Flash memory. His research is translational in nature, and he works closely with several semiconductor industries to solve real life reliability issues. He is a fellow of IEEE and several Indian science and engineering academies (INSA, INAE, IASc). He has a named reliability model (Mahapatra Reliability Model) in Synopsys TCAD simulator.