Modern Methods for Component Measurements using Vector Network Analyzers

#WORCESTER #technical #ieee #microwave #MTT #measurement #network-analyzers
Share

Modern Vector Network Analyzers (VNAs) have flexible hardware and software with much higher performance than VNAs of even a few years ago. Modern VNAs address a wide range of applications, and current versions can address almost every type of RF measurement.  This talk will detail the evolution of Network Analyzers from their early implementation as fast power meters to the advanced component test systems they are today.  We will take a look at the advanced technology inside that allows VNA to achieve supreme accuracy not only in S-parameter measurements, but in nearly all areas of characterization including Noise Figure, TOI, Modulation/Distortion, Spectrum Analysis and Active Device characterization.

 

  



  Date and Time

  Location

  Hosts

  Registration



  • Add_To_Calendar_icon Add Event to Calendar
  • Post Office Pub: Rte. 140 & Ray Street
  • Grafton, Massachusetts
  • United States 01536
  • Room Number: IEEE Room
  • Click here for Map

  • Contact Event Hosts
  • Starts 04 April 2026 04:00 AM UTC
  • Ends 08 May 2026 04:00 AM UTC
  • No Admission Charge


  Speakers

Joel

Topic:

Modern Methods for Component Measurements using Vector Network Analyzers

Modern Vector Network Analyzers (VNAs) have flexible hardware and software with much higher performance than VNAs of even a few years ago. Modern VNAs address a wide range of applications, and current versions can address almost every type of RF measurement.  This talk will detail the evolution of Network Analyzers from their early implementation as fast power meters to the advanced component test systems they are today.  We will take a look at the advanced technology inside that allows VNA to achieve supreme accuracy not only in S-parameter measurements, but in nearly all areas of characterization including Noise Figure, TOI, Modulation/Distortion, Spectrum Analysis and Active Device characterization. 

Biography:

Joel Dunsmore is a Keysight R&D Fellow working at Keysight’s Santa Rosa Site. He received his Ph.D. from Leeds University in 2004. He is a principal contributor to PNA family of network analyzers, with recent work in non-linear test, including differential devices, and mixer measurements, as well as modulated and spectrum measurements.  He has received 37 patents and authored the “Handbook of Microwave Component Measurements, 2nd Edition (John Wiley, 2020)”, and has the YouTube Channel @DrJoelVNA

Email:

Address:Santa Clara, United States





Agenda

  • 6 pm to 6h15 pm: Welcome 
  • 6h15 pm to 7 pm: Presentation
  • 7 pm to 7h15 pm: Q&A
  • 7h15 pm to 8pm: Dinner and Netwoking