IEEE 1687 (iJTAG) workshop: Inside the Chip: Advanced Embedded Diagnostics

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This session explores advanced techniques for embedded instrumentation access, enabling engineers to perform in-depth diagnostics, monitoring, and configuration inside complex integrated circuits.
Participants will learn how IEEE 1687 extends traditional JTAG capabilities to internal chip structures, standardizing access protocols and significantly enhancing system-level debug, validation, and maintenance processes.
The workshop highlights how mastering iJTAG accelerates testing, improves system observability, and reduces product development cycles in modern electronic design.

PDH certificates will be provided.
Offered by the IEEE Oklahoma City Section as part of the 2nd Standard Marathon Program.