[IEEE CAS04/ED15/EP21/PHO36 EDS Distinguished Lecture] Reliability Topics for the Miniaturization and Qualification of Advanced Silicon CMOS Technologies
IEEE Electronic Packaging Society Toronto is proud to invite you to a virtual distinguished lecture by Dr. Fernando Guarin of GlobalFoundries.
Join us Monday, 25 June 2026 at 10AM (ET)
Abstract
Up to this point in the evolution of leading-edge Silicon CMOS technologies the qualification of the latest nodes has been carried out using the methods and targets dictated by digital/logic applications. For RF applications digital centric methodology and metrics will no longer be applicable. We will discuss the reliability impact of miniaturization and the qualification activities driven by the need to support reliable operation for RF circuit applications. The CMOS solutions for RF applications include the introduction of SOI that may introduce additional reliability considerations. The path to maintaining the advanced CMOS scaling cadence and new reliability limiting factors will be examined from the reliability perspective. We will also review the reliability requirements for RF reliability devices and applications as we prepare to introduce technologies to serve the 5G infrastructure requirements. A closer look will be given to Hot Carriers. The characterization, models and qualification methodologies will be put in the required perspective for the successful qualification and transfer of leading-edge technologies to a manufacturing environment.
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- Starts 30 May 2026 04:00 AM UTC
- Ends 25 June 2026 04:00 AM UTC
- No Admission Charge
Speakers
Dr.Fernando Guarin
Biography:
Dr. Fernando Guarin retired in July 2022 as a Distinguished Member of Technical Staff at Global Foundries in East Fishkill New York where he led the reliability team responsible for the qualification of 5G technologies. In 2015 he retired from IBM’s Semiconductor Division after 27 years as Senior Member of Technical Staff. He earned his BSEE from the “Pontificia Universidad Javeriana”, in Bogotá, Colombia, the M.S.E.E. degree from the University of Arizona, and the Ph.D. in Electrical Engineering from Columbia University, NY. He has worked in microelectronic reliability for over 42 years.
From 1980 until 1988 he worked in the Military and Aerospace Operations division of the National Semiconductor Corporation. In 1988 he joined IBM’s microelectronics division where he worked in the reliability physics and modeling of Advanced Bipolar, CMOS and Silicon Germanium BiCMOS technologies. Most recently he was the leader of the team qualifying GlobalFoundries RF 5G technology offerings.
Dr. Guarín is an IEEE Life-Fellow, Distinguished Lecturer for the IEEE Electron Device Society EDS, where he has served in many capacities including member of the IEEE’s EDS Board of governors, chair of the EDS Education Committee, Secretary for EDS. He was the EDS President 2018-2019. He is the Division I Director 2026-2027 for IEEE.
Address:United States