Embedded Mixed-Signal Test & Reliability Monitoring in Biomedical Electronics
Many biomedical and medical-device systems, especially implantable electronics, require mission-critical reliability to support patient safety, therapy delivery, and measurement accuracy. These systems rely heavily on mixed-signal circuits such as sensor front ends, amplifiers, data converters, stimulators, references, clocks, and power-management blocks.
While these circuits are rigorously verified during production test, burn-in, and characterization, long-term reliability challenges can persist after manufacturing. Over a device’s lifetime, circuit behavior can drift due to aging, leakage, environmental stress, packaging effects, and varying operating conditions.
This webinar explores how embedded mixed-signal test and self-monitoring techniques can support the lifetime reliability of biomedical electronics. The discussion will connect traditional production-test concepts with periodic or in-field health monitoring and safe diagnostics. Topics will include analog and mixed-signal built-in self-test (BIST) architectures, embedded current and leakage monitoring, IDDQ-style measurements, burn-in support, self-calibration, and compact diagnostic signatures.
The talk will also highlight how limited external access can be complemented by on-chip diagnostic resources and firmware-coordinated test flows. Ultimately, the session will show how reusing embedded resources can reduce dependence on external test access, improve observability, and support data-driven decisions about device performance and reliability over time.
Date and Time
Location
Hosts
Registration
-
Add Event to Calendar
Loading virtual attendance info...
- Starts 18 June 2026 07:00 AM UTC
- Ends 02 July 2026 05:00 PM UTC
- No Admission Charge
Speakers
Krishna Pramod Madabhushi of Medtronic
Embedded Mixed-Signal Test & Health Monitoring in Biomedical Electronics
Biography:
Krishna Pramod Madabhushi is an IEEE Senior Member and Sr Prin IC Design Engineer at Medtronic, where he works on the architecture, design, verification, and functional assurance of ultra-low-power mixed-signal integrated circuits for implantable medical devices. During more than a decade in medical-device IC development, he has contributed to technologies for cardiac rhythm management and neuromodulation systems.
His work in mixed-signal test includes scalable built-in self-test for sigma-delta data converters, chip-level IDDQ estimation, and firmware-hardware coordinated analog test. He presented this work at the IEEE International Test Conference, the IEEE VLSI Test Symposium, and the Synopsys Users Group Conference. His contributions to self-test strategy for implantable devices were recognized with a Medtronic Technical Excellence Award in 2022.