IC-modeling techniques towards a model-based analysis for EMI/EMC
EMI/EMC contribute to around 30% of failures in the verification stage costing the electronics industry billions in lost revenue. Today, EMI/EMC compliance is achieved by preparing a prototype and performing measurements in a standard laboratory. This results in iterative re-prototyping which causes delays in time-to-market and sometimes leads to cancelled projects and lost opportunities. This presentation will discuss a model-based system-level simulation approach for front-loading EMI/EMC. New research into the generation of IC-models using physics and data-based approaches will be discussed. This approach can ensure first-time compliance pass and reduce system-level functional failures.
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- Starts 22 June 2026 09:30 PM UTC
- Ends 17 July 2026 05:00 AM UTC
- No Admission Charge
Speakers
Simyog Pvt. Tech. Ltd
Nikita Ambasana, Sr. Manager, Customer Success
With over a decade of experience in EMC and signal integrity, Nikita enables engineers to translate simulation into design success. She is a published IEEE researcher and has contributed significantly to EMC innovation in the automotive and aerospace sectors.
Simyog Technology Pvt. Ltd
Sayantan Das, SDE, Team Models
Sayantan specializes in power electronics and computational electromagnetics. Leveraging this foundation, his expertise lies in electromagnetic interference (EMI), with a specific focus on developing models for integrated circuits (ICs) featuring complex converter topologies.