Distinguished Microwave Lecture Series: Modern Methods for Component Measurements using Vector Network Analyzers for 6G Test
Join the IEEE MTT-S of Thompson Okanagan Section for an engaging technical seminar on Modern Methods for Component Measurements Using Vector Network Analyzers (VNAs) for 6G Test. As RF and microwave technologies continue to evolve toward 6G and beyond, accurate and versatile measurement techniques are becoming increasingly important for the design, validation, and characterization of advanced components and systems.
This talk will trace the evolution of VNAs from their early use as fast power meters to today’s highly capable measurement platforms. Participants will gain insight into the advanced hardware and software technologies that enable modern VNAs to deliver high-accuracy measurements across a broad range of applications.
The presentation will cover modern approaches to S-parameter measurements, noise figure, third-order intercept (TOI), modulation and distortion measurements, spectrum analysis, and active-device characterization, with a focus on their relevance to next-generation RF and microwave testing.
Whether you are a student, researcher, practicing engineer, or RF/microwave enthusiast, this event will provide valuable insight into how modern VNA technology is shaping the way components are measured and characterized for 6G and future wireless systems.
All students, faculty, and professionals are welcome. Spots are limited, so kindly RSVP at the earliest. Light food and refreshments will be provided.
Date and Time
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- 1137 Alumni Avenue
- Kelowna, British Columbia
- Canada V1V 1V8
- Building: UBC Okanagan Engineering, Management and Education Building
- Starts 26 August 2026 07:00 AM UTC
- Ends 25 September 2026 07:00 AM UTC
- No Admission Charge
Speakers
Joel Dunsmore of Keysight
Modern Methods for Component Measurements using Vector Network Analyzers for 6G Test
Modern Vector Network Analyzers (VNAs) have flexible hardware and software with much higher performance than VNAs of even a few years ago. Modern VNAs address a wide range of applications, and current versions can address almost every type of RF measurement. This talk will detail the evolution of Network Analyzers from their early implementation as fast power meters to the advanced component test systems they are today. We will take a look at the advanced technology inside that allows VNA to achieve supreme accuracy not only in S-parameter measurements, but in nearly all areas of characterization including Noise Figure, TOI, Modulation/Distortion, Spectrum Analysis and Active Device characterization.
Biography:
Joel Dunsmore is a Keysight R&D Fellow working at Keysight’s Santa Rosa Site. He received his Ph.D. from Leeds University in 2004. He is a principal contributor to PNA family of network analyzers, with recent work in non-linear test, including differential devices, and mixer measurements, as well as modulated and spectrum measurements. He has received 37 patents and authored the “Handbook of Microwave Component Measurements, 2nd Edition (John Wiley, 2020)”, and has the YouTube Channel @DrJoelVNA.
Agenda
9:30 AM - Lecture Begin
11 AM - Lecture Ends
11.30 AM - Social Mixer