Cher-Ming of Chang-Gung University

Reliability and failure physics modeling of electronic components and systems. Finite element modeling of materials degradation. Reliability of Li Ion battery and high power LEDs. Statistical modeling of engineering systems. Nano-materials and devices reliability. Prognosis & health management of engineering system.

Biography:

Prof Tan received his Ph.D in Electrical Engineering from the University of Toronto in 1992. He has 8 years of working experiences in reliability in electronic industry (both Singapore and Taiwan) before joining Nanyang Technological University (NTU) as faculty member in 1996 till 2014. He is now a Professor in Chang Gung University, Taiwan and Director of Centre of Reliability Science and Technology.

He has published more than 270 International Journal and Conference papers, and holding 10 patents and 1 copyright for reliability software. He has given more than 50 invited talks in International Conferences. He has written 5 books and 4 book chapters in the field of reliability. He is also the Series Editor of Springer Brief in Reliability.

He is the past chair of IEEE Singapore Section, Senior member of IEEE and ASQ, Distinguish Lecturer of IEEE Electronic Device Society on reliability, Founding Chair of IEEE Nanotechnology Chapter - Singapore Section, Standing Committee Chair of IEEE International Nanoelectronics Conference, Fellow of Institute of Engineers, Singapore, Fellow of Singapore Quality Institute, Ex-Chair of all the quality and reliability certification programs in Singapore, Executive council member of Singapore Quality Institute, Technical Assessor to the Certification Laboratories in Singapore, Ex-Director of SIMTech-NTU Reliability Lab. He is an Editor of IEEE TDMR, Member of Editorial Advisory Board of Microelectronics Reliability, Editor of The Scientific World Journal, Associated Editor of International Journal on Computing, and Guest Editor of International J. of Nanotechnology, Nano-research letter and Microelectronic Reliability. He is the only awardee in Singapore for the Ishikawa-Kano Quality Award from Japan.

His research interests include reliability and failure physics modeling of electronic components and systems, finite element modeling of materials degradation, reliability of Li Ion battery and high power LEDs, statistical modeling of engineering systems, nano-materials and devices reliability, and prognosis & health management of engineering system.

Email:

Address:Chang-Gung University, Taiwan, Taiwan, Taiwan, 333323