VNA Measurements and De-embedding for High Speed and RF Applications
Webinar Description:
Join us for an insightful webinar focused on the critical topic of de-embedding in high-frequency and high-speed digital designs. As the demand for faster and more reliable electronic devices continues to grow, understanding de-embedding techniques has become essential for engineers and designers working in the fields of RF, microwave, and digital signal integrity.
What You Will Learn:
- The fundamentals of VNA measurements
- What S-parameters are and how they are used to measure network
· The importance of calibration in network analyzer measurements
- Fundamentals of De-Embedding
- Test fixture performance criteria
- Demo of De-embedding with R&S ZNA
Who Should Attend:
This webinar is ideal for engineers, designers, and technicians involved in RF, microwave, and high-speed digital circuit design and testing. Whether you are a seasoned professional or new to the field, this session will provide valuable insights to enhance your understanding and skills.
Date and Time
Location
Hosts
Registration
- Date: 31 Mar 2025
- Time: 06:00 PM UTC to 07:15 PM UTC
-
Add Event to Calendar
- Starts 12 March 2025 04:00 AM UTC
- Ends 31 March 2025 06:00 PM UTC
- 0 virtual spaces left!
- No Admission Charge
Speakers
Mahwash Arjumand of Rohde & Schwarz Canada
Biography:
Mahwash is an Application Engineer in Rohde & Schwarz. She has over 14 years of experience in RF and µW test & measurement products.