VNA Measurements and De-embedding for High Speed and RF Applications

#emc #telecommunication #6G #Antennas #High-speed #RF #PCIe #Calibration #WIE
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Webinar Description:

Join us for an insightful webinar focused on the critical topic of de-embedding in high-frequency and high-speed digital designs. As the demand for faster and more reliable electronic devices continues to grow, understanding de-embedding techniques has become essential for engineers and designers working in the fields of RF, microwave, and digital signal integrity.

What You Will Learn:

  • The fundamentals of VNA measurements
  • What S-parameters are and how they are used to measure network

·       The importance of calibration in network analyzer measurements

  • Fundamentals of De-Embedding
  • Test fixture performance criteria
  • Demo of De-embedding with R&S ZNA

Who Should Attend:

This webinar is ideal for engineers, designers, and technicians involved in RF, microwave, and high-speed digital circuit design and testing. Whether you are a seasoned professional or new to the field, this session will provide valuable insights to enhance your understanding and skills.



  Date and Time

  Location

  Hosts

  Registration



  • Date: 31 Mar 2025
  • Time: 06:00 PM UTC to 07:15 PM UTC
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  • Starts 12 March 2025 04:00 AM UTC
  • Ends 31 March 2025 06:00 PM UTC
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  • No Admission Charge


  Speakers

Mahwash Arjumand of Rohde & Schwarz Canada

Biography:

Mahwash is an Application Engineer in Rohde & Schwarz. She has over 14 years of experience in RF and µW test & measurement products.