Alfredo Díaz González of Oxford Instruments America, Inc.

Material properties affect the performance of electronic devices. Material characterization techniques can be used to analyze a wide range of properties. Mainly, we will focus on Scanning Electron Microscope (SEM) based techniques that are commonly used to characterize materials. For example, Energy Dispersive Spectrometry (EDS) is used to identify chemistry distribution within a surface while Electron Backscatter Diffraction (EBSD) provides information about the grain size, crystal structure and orientation, among others. This presentation will offer an overview of some characterization techniques, discussing how the techniques work and what information can be obtained from them. Some examples of applications will be shared to illustrate how they can solve research problems.

Biography:

Alfredo Díaz González is an Applications Specialist at Oxford Instruments NanoAnalysis and holds a M.S. and Ph.D. in Mechanical Engineering from University of Puerto Rico and The George Washington University, respectively. As part of his research, he worked in the development of electrically conductive nanocomposites, development of AFM methods and structure-property relations in nanomaterials. He joined Oxford Instruments in 2018 as a customer service engineer and later transitioned into applications.