Kyungjin "Jin" Min of API

EMC Scan Technologies

Near field scanning is a widely known and well received method for component, module and system EMC characterization. One specific emission scan technology, called the NF EMI scan, is the most common scan technology, but the immunity scan is relatively less known and less widely used. Three immunity and two emission scan technologies will be presented: ESD Scan, RF Immunity Scan, Current Spreading (CSP) and Phase Measurement Scan.

ESD scan is a very effective scan technique to debug or pre-screen components or modules that are more likely to cause problems (specially soft failures) before they are integrated to a system. Its main goal is localizing weak spots or traces causing ESD gun test failures with a well-controlled disturbance source.

RF Immunity Scan is very similar to ESD scan in concept, but it is a narrow-band scan while the ESD scan is a wide-band.

Most currents injected by an ESD gun follow the intended path by design, but a small amount causing system upset can flow through an unexpected route. CSP (Current Spreading) is a visualization technique for surface current flows, which identifies unexpected current paths and can verify ESD protection design.

Phase information helps improving accuracies of modeling of EUT's for simulation or can be directly used for specific applications. Specific application of the phase information will be introduced after brief review of simultaneous magnitude and phase measurement in time and frequency domain.

Biography:

Jin Min was born in Korea and immigrated to USA in 1982. He earned his Ph.D. in electrical engineering from North Carolina State University in 1998. After working at LSI Logic and Perkin-Elmer for a few years, he co-founded Amber Precision Instruments (API) in 2006, which develops EMC scan technologies and manufactures EMC scanners in 2006. He is currently the president of API which is headquartered in San Jose, California, USA